Plenary and invited speakers

PLENARY SPEAKERS

- Dr. Jean-Nicolas AUDINOT, Luxembourg Institute of Science and Technology, Luxembourg

"Lithium imaging performed on Focused Ion Beam Platforms coupled with Mass Spectrometer"

Dr Jean-Nicolas Audinot’ research is based on the correlation of the state-of-the-art microscopies (TEM, FIB, AFM) with secondary ion mass spectrometry (SIMS) technique. For the past years, he has been deeply involved in the development of a compact high-performance mass spectrometer, based on SIMS technique, coupled to the Focused Ion Beam - based platforms, that has allowed prospects towards in-situ characterization and correlative microscopy in materials sciences. He developed methodologies for the sample preparation (e.g. cryo preparation) and for combined analytical and structural characterization analyses (e.g. AFM and SIMS) in the field of the nano-toxicology studies and materials for energy (photovoltaic, batteries).

- Pr. Philippe BARBOUX, Chimie ParisTech, France

"Lithium sourcing for lithium batteries"

INVITED SPEAKERS

 - Dr. Michel TRUDEAU, Center of Excellence in Transportation Electrification and Energy Storage, IREQ, Varennes, Canada

"Spatially-resolved EELS analysis of surface species on metallic lithium for the development of next generation Li-batteries"

- Dr. Cécile FABRE, Université de Lorraine, Nancy, France

"Contribution of LIBS to the analysis of lithium in minerals and rocks"

- Dr. Eric DE VITO, French Atomic Energy and Alternative Energy Commission, Grenoble, France

 "Complementarity, strengths and limitations of XPS/AES, ToF-SIMS and ssNMR spectroscopies for detection and quantification of lithium in battery materials"

- Dr. Anja HENß, Justus-Liebig University Giessen, Germany

 "The role of the native passivation layer on lithium metal anodes for battery research"

- Dr. Feng WANG, Argonne National Laboratory, USA

"Probing lithium-ion transport in battery materials using transmission electron microscopy-electron energy-loss spectroscopy"